SN54LVT182512 גיליון נתונים, במעגל, פונקציה
SN54LVT182512 Datasheet PDF
| יצרן | אריזה | תיאור | טמפרטורת | |
|---|---|---|---|---|
| Texas Instruments | 3.3-V SCAN TEST DEVICES WITH 18-BIT UNIVERSAL TRANSCEIVERS |
SN54LVT182512 PDF | מינימום°C | מקסימלי°C |
- Texas Instruments SN54LVT182512
3.3-V SCAN TEST DEVICES WITH 18-BIT UNIVERSAL TRANSCEIVERS - Texas Instruments SN54LVT182512HKC
3.3-V SCAN TEST DEVICES WITH 18-BIT UNIVERSAL TRANSCEIVERS - Texas Instruments SN54LVT18502
3.3-V SCAN TEST DEVICE WITH 18-BIT UNIVERSAL TRANSCEIVERS - Texas Instruments SN54LVT18502HV
3.3-V SCAN TEST DEVICE WITH 18-BIT UNIVERSAL TRANSCEIVERS - Texas Instruments SN54LVT18512
3.3-V SCAN TEST DEVICES WITH 18-BIT UNIVERSAL TRANSCEIVERS - Texas Instruments SN54LVT18512HKC
3.3-V SCAN TEST DEVICES WITH 18-BIT UNIVERSAL TRANSCEIVERS